Institute for Physics
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Item type:Publication, Characterization of electrochromic Prussian blue device by impedance spectroscopy(AIP Publishing LLC, 2016) - Some of the metrics are blocked by yourconsent settings
Item type:Publication, Stress induced degradation in RF deposited Ta/sub 2/O/sub 5/ films on silicon(IEEE, 2002) - Some of the metrics are blocked by yourconsent settings
Item type:Publication, Dielectric response and electric modulus of Y2CrCoO6 perovskite(AIP Publishing LLC, 2016) - Some of the metrics are blocked by yourconsent settings
Item type:Publication, Conduction mechanisms in thin RF sputtered Ta/sub 2/O/sub 5/ films on Si and their dependence on O/sub 2/ annealing(IEEE, 2002) - Some of the metrics are blocked by yourconsent settings
Item type:Publication, Stress induced degradation in RF deposited Ta/sub 2/O/sub 5/ films on silicon(IEEE, 2000) - Some of the metrics are blocked by yourconsent settings
Item type:Publication, Stress Degradation of Low Field Leakage in Alumina Gate MOS Structures Containing RF Magnetron Sputtered Thin Ta2O5 Films on Silicon(Wiley, 1999-04) - Some of the metrics are blocked by yourconsent settings
Item type:Publication, Density and spatial distribution of MERIE-like plasma induced defects in SiO2(Wiley, 2003-09) - Some of the metrics are blocked by yourconsent settings
Item type:Publication, Electrical properties of thin RF sputtered Ta2O5 films after constant current stress(Elsevier BV, 2003-02) - Some of the metrics are blocked by yourconsent settings
Item type:Publication, Mg2KH(XO4)2·15H2O (X = P, As) containing acidic dimer units: Electrochemical impedance spectroscopy, IR spectroscopy and DSC studies(Elsevier BV, 2018-05) - Some of the metrics are blocked by yourconsent settings
Item type:Publication, Correlation between composition, electrical and electrochemical properties of LnCo1-xCrxO3 (Ln = Pr, Gd and x = 0, 0.5 and 1) perovskites(Springer Science and Business Media LLC, 2019-01-06)