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search.filters.author.Dimitrova, T.
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Novkovski, N.
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Pecovska-Gjorgjevich, M.
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Atanassova, E.
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Atanassova, Elena
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Item type:
Publication
,
Stress induced degradation in RF deposited Ta/sub 2/O/sub 5/ films on silicon
(
IEEE
,
2002
)
Novkovski, N.
;
Pecovska-Gjorgjevich, M.
;
Atanassova, E.
;
Dimitrova, T.
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Item type:
Publication
,
Stress induced degradation in RF deposited Ta/sub 2/O/sub 5/ films on silicon
(
IEEE
,
2000
)
Novkovski, N.
;
Pecovska-Gjorgjevich, M.
;
Atanassova, E.
;
Dimitrova, T.
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Stress Degradation of Low Field Leakage in Alumina Gate MOS Structures Containing RF Magnetron Sputtered Thin Ta2O5 Films on Silicon
(
Wiley
,
1999-04
)
Novkovski, N.
;
Pecovska-Gjorgjevich, M.
;
Atanassova, Elena
;
Dimitrova, T.
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