X-ray diffraction analysis on layers in graphene samples obtained by electrolysis in molten salts: a new perspective

Abstract

There are several accepted methods used for X-ray diffraction analysis on graphene layers and sample’s stacking height LC. The Scherrer equation is avoided since the layers in the graphene samples are non-uniformly distributed and therefore the samples have non-uniform thickness. Instead, a model that includes thickness distribution is used to calculate the average number of layers and then the stacking height. The analysis was performed on 12 graphene samples produced by high-temperature electrolysis in molten salts. Another method that was used to calculate the number of layers and hence the samples’ stacking height, was Raman spectra C-peak position method. It served as a control model for the analysed samples, since for four samples the corresponding parts of the Raman spectra were not usable due to the very low-frequency region. However, the obtained results of both methods were in agreement, and indicate that studied graphene samples are few layered.