Please use this identifier to cite or link to this item:
http://hdl.handle.net/20.500.12188/420
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Beti Andonovic, Anita Grozdanov, Perica Paunović, Aleksandar T. Dimitrov | en_US |
dc.date.accessioned | 2018-10-27T19:53:58Z | - |
dc.date.available | 2018-10-27T19:53:58Z | - |
dc.date.issued | 2015-12 | - |
dc.identifier.uri | http://hdl.handle.net/20.500.12188/420 | - |
dc.description.abstract | There are several accepted methods used for X-ray diffraction analysis on graphene layers and sample’s stacking height LC. The Scherrer equation is avoided since the layers in the graphene samples are non-uniformly distributed and therefore the samples have non-uniform thickness. Instead, a model that includes thickness distribution is used to calculate the average number of layers and then the stacking height. The analysis was performed on 12 graphene samples produced by high-temperature electrolysis in molten salts. Another method that was used to calculate the number of layers and hence the samples’ stacking height, was Raman spectra C-peak position method. It served as a control model for the analysed samples, since for four samples the corresponding parts of the Raman spectra were not usable due to the very low-frequency region. However, the obtained results of both methods were in agreement, and indicate that studied graphene samples are few layered. | en_US |
dc.language.iso | en | en_US |
dc.publisher | The Institution of Engineering and Technology | en_US |
dc.relation.ispartof | Micro & Nano Letters | en_US |
dc.title | X-ray diffraction analysis on layers in graphene samples obtained by electrolysis in molten salts: a new perspective | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1049/mnl.2015.0325 | - |
item.grantfulltext | open | - |
item.fulltext | With Fulltext | - |
Appears in Collections: | Faculty of Technology and Metallurgy: Journal Articles |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
2015 M&NL.pdf | 276.47 kB | Adobe PDF | View/Open |
Page view(s)
56
Last Week
0
0
Last month
2
2
checked on Apr 28, 2024
Download(s)
81
checked on Apr 28, 2024
Google ScholarTM
Check
Altmetric
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.