Please use this identifier to cite or link to this item: http://hdl.handle.net/20.500.12188/11220
Title: Evaluating intrinsic origin of frequency dependence of dielectric permittivity of high-k dielectrics
Authors: Stojanovska-Georgievska, Lihnida
Sandeva, Ivana
Krleski, Aleksandar
Spasevska, Hristina 
Ginovska, Margarita 
Issue Date: May-2019
Publisher: World Congress on Functional Materials and Nanotechnology (WCFMN-2019), Valencia, Spain
URI: http://hdl.handle.net/20.500.12188/11220
Appears in Collections:Faculty of Electrical Engineering and Information Technologies: Conference Papers

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