Please use this identifier to cite or link to this item: http://hdl.handle.net/20.500.12188/11220
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dc.contributor.authorStojanovska-Georgievska, Lihnidaen_US
dc.contributor.authorSandeva, Ivanaen_US
dc.contributor.authorKrleski, Aleksandaren_US
dc.contributor.authorSpasevska, Hristinaen_US
dc.contributor.authorGinovska, Margaritaen_US
dc.date.accessioned2021-03-23T12:43:07Z-
dc.date.available2021-03-23T12:43:07Z-
dc.date.issued2019-05-
dc.identifier.urihttp://hdl.handle.net/20.500.12188/11220-
dc.language.isoenen_US
dc.publisherWorld Congress on Functional Materials and Nanotechnology (WCFMN-2019), Valencia, Spainen_US
dc.titleEvaluating intrinsic origin of frequency dependence of dielectric permittivity of high-k dielectricsen_US
dc.typeArticleen_US
item.fulltextNo Fulltext-
item.grantfulltextnone-
crisitem.author.deptFaculty of Electrical Engineering and Information Technologies-
crisitem.author.deptFaculty of Electrical Engineering and Information Technologies-
Appears in Collections:Faculty of Electrical Engineering and Information Technologies: Conference Papers
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