Please use this identifier to cite or link to this item:
http://hdl.handle.net/20.500.12188/10984| Title: | Determination Method for Interface State Densities Adapted to Ultrathin Dielectrics | Authors: | Novkovski, N. Skeparovski, A. |
Issue Date: | Sep-2019 | Publisher: | IEEE | Conference: | 2019 IEEE 31st International Conference on Microelectronics (MIEL) | URI: | http://hdl.handle.net/20.500.12188/10984 | DOI: | 10.1109/miel.2019.8889574 |
| Appears in Collections: | Faculty of Natural Sciences and Mathematics: Journal Articles |
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