Please use this identifier to cite or link to this item:
http://hdl.handle.net/20.500.12188/10984| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Novkovski, N. | en_US |
| dc.contributor.author | Skeparovski, A. | en_US |
| dc.date.accessioned | 2021-03-16T09:36:29Z | - |
| dc.date.available | 2021-03-16T09:36:29Z | - |
| dc.date.issued | 2019-09 | - |
| dc.identifier.uri | http://hdl.handle.net/20.500.12188/10984 | - |
| dc.language.iso | en | en_US |
| dc.publisher | IEEE | en_US |
| dc.title | Determination Method for Interface State Densities Adapted to Ultrathin Dielectrics | en_US |
| dc.type | Article | en_US |
| dc.relation.conference | 2019 IEEE 31st International Conference on Microelectronics (MIEL) | en_US |
| dc.identifier.doi | 10.1109/miel.2019.8889574 | - |
| dc.identifier.url | http://xplorestaging.ieee.org/ielx7/8883095/8889568/08889574.pdf?arnumber=8889574 | - |
| item.fulltext | No Fulltext | - |
| item.grantfulltext | none | - |
| Appears in Collections: | Faculty of Natural Sciences and Mathematics: Journal Articles | |
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