Please use this identifier to cite or link to this item:
http://hdl.handle.net/20.500.12188/10931| Title: | The thickness of SnO2:F films as principal factor of their properties | Authors: | G. Mavrodiev, A. Georgievski, M. Gajdardžiska-Josifovska, V. Jordanovska, | Issue Date: | 1987 | Journal: | Annuaire − Physique, 37, 15– 22 (1987). | URI: | http://hdl.handle.net/20.500.12188/10931 |
| Appears in Collections: | Faculty of Natural Sciences and Mathematics: Journal Articles |
Files in This Item:
| File | Size | Format | |
|---|---|---|---|
| XIII_0329.pdf | 1.97 MB | Adobe PDF | View/Open |
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