Please use this identifier to cite or link to this item:
http://hdl.handle.net/20.500.12188/10931| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | G. Mavrodiev, A. Georgievski, M. Gajdardžiska-Josifovska, V. Jordanovska, | en_US |
| dc.date.accessioned | 2021-03-16T08:55:04Z | - |
| dc.date.available | 2021-03-16T08:55:04Z | - |
| dc.date.issued | 1987 | - |
| dc.identifier.uri | http://hdl.handle.net/20.500.12188/10931 | - |
| dc.language.iso | en_US | en_US |
| dc.relation.ispartof | Annuaire − Physique, 37, 15– 22 (1987). | en_US |
| dc.title | The thickness of SnO2:F films as principal factor of their properties | en_US |
| dc.type | Journal Article | en_US |
| item.grantfulltext | open | - |
| item.fulltext | With Fulltext | - |
| Appears in Collections: | Faculty of Natural Sciences and Mathematics: Journal Articles | |
Files in This Item:
| File | Size | Format | |
|---|---|---|---|
| XIII_0329.pdf | 1.97 MB | Adobe PDF | View/Open |
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