Please use this identifier to cite or link to this item: http://hdl.handle.net/20.500.12188/424
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dc.contributor.authorBeti Andonovic, Misela Temkov, Abdulakim Ademi, Aleksandar Petrovski, Anita Grozdanov, Perica Paunović, Aleksandar Dimitroven_US
dc.date.accessioned2018-10-27T20:11:37Z-
dc.date.available2018-10-27T20:11:37Z-
dc.date.issued2014-06-
dc.identifier.urihttp://hdl.handle.net/20.500.12188/424-
dc.description.abstractThe present study reports data referring to the determination of the layers of graphene samples obtained by electrolysis in aqueous electrolytes and molten salts using a reverse change of the potential applied. The analysis, based on the calculation of 002 XRD peak intensities, is carried out with the application of the Scherrer equation and the Laue functions model. The latter results differ from those obtained on the ground of Scherrer equation but coincide with data obtained by Raman spectroscopy and other methods. This is attributed to the multi-layer structure of the graphene samples studied.en_US
dc.language.isoenen_US
dc.publisherUniversity of Chemical Technology and Metallurgy, Sofia, Bulgariaen_US
dc.relation.ispartofJournal of Chemical Technology and Metallurgyen_US
dc.titleLaue functions model vs Scherrer equation in determination of graphene layers number on the ground of XRD dataen_US
dc.typeArticleen_US
item.grantfulltextopen-
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Appears in Collections:Faculty of Technology and Metallurgy: Journal Articles
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