Please use this identifier to cite or link to this item:
http://hdl.handle.net/20.500.12188/16073| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Ristova, M. M. | en_US |
| dc.contributor.author | Mirceski, V. | en_US |
| dc.contributor.author | Neskovska, R. | en_US |
| dc.date.accessioned | 2022-01-10T08:02:49Z | - |
| dc.date.available | 2022-01-10T08:02:49Z | - |
| dc.date.issued | 2014-10-31 | - |
| dc.identifier.uri | http://hdl.handle.net/20.500.12188/16073 | - |
| dc.publisher | Springer Science and Business Media LLC | en_US |
| dc.relation.ispartof | Journal of Solid State Electrochemistry | en_US |
| dc.title | Voltammetry of chemically deposited Cu x O electrochromic films, coated with ZnO or TiO2 electrocatalyst layers | en_US |
| dc.identifier.doi | 10.1007/s10008-014-2666-x | - |
| dc.identifier.url | http://link.springer.com/content/pdf/10.1007/s10008-014-2666-x.pdf | - |
| dc.identifier.url | http://link.springer.com/article/10.1007/s10008-014-2666-x/fulltext.html | - |
| dc.identifier.url | http://link.springer.com/content/pdf/10.1007/s10008-014-2666-x | - |
| dc.identifier.volume | 19 | - |
| dc.identifier.issue | 3 | - |
| item.grantfulltext | none | - |
| item.fulltext | No Fulltext | - |
| Appears in Collections: | Faculty of Natural Sciences and Mathematics: Journal Articles | |
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