Please use this identifier to cite or link to this item:
http://hdl.handle.net/20.500.12188/14768| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | J. Bloch, B. Pejova, J. Jacob, B. Hjörvarsson, | en_US |
| dc.date.accessioned | 2021-09-21T08:50:00Z | - |
| dc.date.available | 2021-09-21T08:50:00Z | - |
| dc.date.issued | 2010 | - |
| dc.identifier.uri | http://hdl.handle.net/20.500.12188/14768 | - |
| dc.description | J. Bloch, B. Pejova, J. Jacob, B. Hjörvarsson, Hydrogen-vanadium system in thin films: Effect of film thickness, Physical Review B, 82, 245428 (2010). | en_US |
| dc.language.iso | en_US | en_US |
| dc.relation.ispartof | Physical Review B, 82, 245428 (2010). | en_US |
| dc.title | Hydrogen-vanadium system in thin films: Effect of film thickness | en_US |
| dc.type | Journal Article | en_US |
| dc.identifier.doi | DOI:10.1103/PhysRevB.82.245428 | - |
| item.grantfulltext | none | - |
| item.fulltext | No Fulltext | - |
| Appears in Collections: | Faculty of Natural Sciences and Mathematics: Journal Articles | |
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