Please use this identifier to cite or link to this item:
http://hdl.handle.net/20.500.12188/13614| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | V. Mirčeski, R. Gulaboski, F. Scholz, | en_US |
| dc.date.accessioned | 2021-06-16T13:14:57Z | - |
| dc.date.available | 2021-06-16T13:14:57Z | - |
| dc.date.issued | 2004 | - |
| dc.identifier.uri | http://hdl.handle.net/20.500.12188/13614 | - |
| dc.relation.ispartof | Journal of Electroanalytical Chemistry, 566, 351–360 (2004). | en_US |
| dc.title | Square-wave thin-film voltammetry in the presence of uncompensated resistance and charge transfer kinetics | en_US |
| dc.identifier.doi | https://doi.org/10.1016/j.jelechem.2003.11.046 | - |
| item.grantfulltext | none | - |
| item.fulltext | No Fulltext | - |
| Appears in Collections: | Faculty of Natural Sciences and Mathematics: Journal Articles | |
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