X-ray diffraction analysis on layers in graphene samples obtained by electrolysis in molten salts: a new perspective
Journal
Micro & Nano Letters
Date Issued
2015-12
Author(s)
Beti Andonovic, Anita Grozdanov, Perica Paunović, Aleksandar T. Dimitrov
DOI
10.1049/mnl.2015.0325
Abstract
There are several accepted methods used for X-ray diffraction analysis on graphene layers and sample’s stacking height LC. The Scherrer equation is avoided since the layers in the graphene samples are non-uniformly distributed and therefore the samples have non-uniform
thickness. Instead, a model that includes thickness distribution is used to calculate the average number of layers and then the stacking height. The analysis was performed on 12 graphene samples produced by high-temperature electrolysis in molten salts. Another method
that was used to calculate the number of layers and hence the samples’ stacking height, was Raman spectra C-peak position method. It served as a control model for the analysed samples, since for four samples the corresponding parts of the Raman spectra were not usable
due to the very low-frequency region. However, the obtained results of both methods were in agreement, and indicate that studied graphene samples are few layered.
thickness. Instead, a model that includes thickness distribution is used to calculate the average number of layers and then the stacking height. The analysis was performed on 12 graphene samples produced by high-temperature electrolysis in molten salts. Another method
that was used to calculate the number of layers and hence the samples’ stacking height, was Raman spectra C-peak position method. It served as a control model for the analysed samples, since for four samples the corresponding parts of the Raman spectra were not usable
due to the very low-frequency region. However, the obtained results of both methods were in agreement, and indicate that studied graphene samples are few layered.
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