Faculty of Technology and Metallurgy

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End date: 2019Subject: search.filters.subject.ellipsometry

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    Electrochemical formation of semi-conducting oxides for solar energy conversion
    (WORLD SCIENTIFIC AND ENGINEERING ACAD AND SOC, 2007)
    ;
    Prusi, Abdurauf
    ;
    Arsov, Ljubomir
    The formation of anodic oxide films on Nb electrodes in 1 M H2SO4 and 1 M KOH, for potential region from 0 to 90 V SCE, have been investigated. The film thickness growth, refractive indices and dielectric constants of formed films, depending of applied potential and time of anodization, have been determined using ellipsometric method. By Raman spectroscopical measurements the amorphous structure of anodic oxide films, up to 10 V SCE and progressive evolution of crystallization from 10 to 90 V has been shown. The semi-conducting properties (n or p tip semi-conductor, energy gap and flat bend potentials) has been determined using photocurrent measurements.
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    Reflectivity from electrochemically protected Nb surfaces
    (Engineering Society of Corrosion, 2015-06-15)
    Corrosion resistance of fine mechanically polished and electro-polished Nb surfaces were tested by elliposmetric measurements the reflectivity at various angle of incidence. The same measurements were also repeated on electro-polished Nb surface anodic ally oxidized in 1M H2SO4 during 30 s in the potential/voltage range from 0 to 100 V. From the minimum value of measured reflectivity parallel to plane of incidence, the Brewster angle for each investigated sample was determined. The simultaneous measurements of corrosion parameters Brewster angle have shown that the values of Brewster's angle should be used for fast testing the quality of protected metal surfaces.
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    Electrochemical behavior of tantalum in potassium hydroxide solutions
    (International Association of Physical Chemists (IAPC), 2018-08-31)
    The electrochemical behavior of tantalum in various concentrations of KOH solutions (0.1 M -10 M), was investigated using the evolution of the open circuit potentialin time, cyclic voltammetry and ellipsometricmeasurements. Depending on KOH concentrations, the open circuit potential measurements have shown three distinct behaviors concerning oxide film formation on the electrode surface and its dissolution. The cyclic voltammetry measurements were performed in various potential ranges, from -1.4 to 8 V, different concentrations of KOH solutions (0.110 M) and sweep rates ranging from 0.005 V/s to 1 V/s. In the passive region, very stable passive films were formed, which reduction has not been possible during cathodic polarization even at highly concentrated KOH solutions. In the trans-passive region, the very strong peak at 1.65 V was monitored, which nature and chemical composition is still not well known.