Please use this identifier to cite or link to this item: http://hdl.handle.net/20.500.12188/26089
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dc.contributor.authorMarija Cundeva, Ljupco Arsov, Goga Cvetkovskien_US
dc.date.accessioned2023-03-14T07:48:34Z-
dc.date.available2023-03-14T07:48:34Z-
dc.date.issued2004-09-01-
dc.identifier.citationCundeva, M., Arsov, L. and Cvetkovski, G. (2004), "Genetic algorithm coupled with FEM‐3D for metrological optimal design of combined current‐voltage instrument transformer", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 23 No. 3, pp. 670-676. https://doi.org/10.1108/033216404105405en_US
dc.identifier.urihttp://hdl.handle.net/20.500.12188/26089-
dc.description.abstracthe combined current‐voltage instrument transformer (CCVIT) is a complex non‐linear electromagnetic system with increased voltage, current and phase displacement errors. Genetic algorithm (GA) coupled with finite element method (FEM‐3D) is applied for CCVIT optimal design. The optimal design objective function is the metrological parameters minimum. The magnetic field analysis made by FEM‐3D enables exact estimation of the four CCVIT windings leakage reactances. The initial CCVIT design is made according to analytical transformer theory. The FEM‐3D results are a basis for the further GA optimal design. Compares the initial and GA optimal output CCVIT parameters. The GA coupled with FEM‐3D derives metrologically positive design results, which leads to higher CCVIT accuracy class.en_US
dc.language.isoenen_US
dc.publisherEmerald Publishing Limiteden_US
dc.relation.ispartofCOMPEL The International Journal for Computational and Mathematics in Electrical and Electronic Engineeringen_US
dc.subjectGenetic algorithms, transformers, finite elemen methoden_US
dc.titleGenetic Algorithm Coupled with FEM-3D for Metrological Optimal Design of Combined Current-Voltage Instrument Transformeren_US
dc.typeJournal Articleen_US
dc.identifier.doi10.1108/03321640410540584-
dc.identifier.urlhttps://www.emerald.com/insight/content/doi/10.1108/03321640410540584/full/html-
dc.identifier.volume23-
dc.identifier.issue3-
dc.identifier.fpage670-
dc.identifier.lpage676-
item.grantfulltextnone-
item.fulltextNo Fulltext-
Appears in Collections:Faculty of Electrical Engineering and Information Technologies: Journal Articles
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