Browsing by Author A. Skeparovski; D. Spassov; A. Paskaleva; N. Novkovski
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| Preview | Title | Author(s) | Issue Date | Type |
|---|---|---|---|---|
| A case study of C-V hysteresis instability in metal-high-k-oxide-silicon devices with ZrO2/Al2O3/Zr2O2 stack as a charge trapping layer | A. Skeparovski; D. Spassov; A. Paskaleva; N. Novkovski | 14-Dec-2017 |